- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 5/28 - Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
Patent holdings for IPC class G01B 5/28
Total number of patents in this class: 493
10-year publication summary
|
26
|
30
|
29
|
27
|
35
|
28
|
12
|
14
|
10
|
5
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Mitutoyo Corporation | 1218 |
34 |
| Bruker Nano, Inc. | 334 |
17 |
| The Boeing Company | 19843 |
16 |
| Tokyo Seimitsu Co., Ltd. | 257 |
14 |
| Carl Mahr Holding GmbH | 118 |
7 |
| Carl Zeiss Industrielle Messtechnik GmbH | 433 |
6 |
| The Regents of the University of California | 18943 |
5 |
| Hitachi, Ltd. | 16452 |
5 |
| JENOPTIK Industrial Metrology Germany GmbH | 15 |
5 |
| Renishaw plc | 739 |
5 |
| Honeywell International Inc. | 13799 |
4 |
| NEC Corporation | 32703 |
4 |
| Georgia Tech Research Corporation | 2453 |
4 |
| KLA-Tencor Technologies Corporation | 346 |
4 |
| Oxford Instruments Asylum Research, Inc. | 34 |
4 |
| Veeco Instruments Inc. | 332 |
4 |
| Agc, Inc. | 4029 |
4 |
| Papadimitriou, Wanda | 12 |
4 |
| Stylwan IP Holding, LLC | 12 |
4 |
| The Jason Papadimitriou Irrevocable Trust | 12 |
4 |
| Other owners | 339 |